Magazine article Science News

Atomic Shadow-Puppetry Reveals Structure

Magazine article Science News

Atomic Shadow-Puppetry Reveals Structure

Article excerpt

Atomic shadow-puppetry reveals structure

Those educational films shown in grade school would seem incomplete without little fingers jutting in front of the projector to animate the screen with wiggly rabbits and flying birds. When properly staged, atoms accomplish a remarkably similar effect, according to five chemists who say they have learned both to produce atomic shadow-shows and to intepret them as structural revelations of a solid materialshs topmost atomic or molecular layers.

The group already hs used the new technique -- called angular distribution Auger microscopy, or ADAM -- to map surfaces of pure metals with and without other atomic or molecular coatings. "It produces very sharp and straightforward images of atomic structure," says research leader Arthur T. Hubbard of the University of Cincinnati.

The first scientists to apply ADAM to their work wil be solid-state physicists interested in the details of how atomic layers stack into, say, semiconductor devices such as thin-film lasers, Hubbard predicts. The technique should also prove useful for studying polymer films, catalysts and even dynamic phenomena such as atomic vibrtions, he adds.

French researcher Pierre Auger discovered the underlying principle in 1925. Bombarding an atom with radiation, such as X-rays or high-energy electrons, tends to dislodge and expel an electron circling in one of the atom's inner orbitals. A less tightly bound electron orbiting farther away then falls into the more internal vacancy while the atom ejects a third, "Auger" electron. Since atoms of particular elements eject electrons at characteristic energies, measuring the energies of the fleeing Auger electrons identifies the parent atoms. Scientists have used Auger electrons since the mid-1960s to determine the elemental compositions of materials.

Many researchers have noted that the number of Auger electrons measured varies as the electron detector's angular view of the sample changes. …

Search by... Author
Show... All Results Primary Sources Peer-reviewed


An unknown error has occurred. Please click the button below to reload the page. If the problem persists, please try again in a little while.