Magazine article International Trade Forum

Putting Market Access Issues on the Map

Magazine article International Trade Forum

Putting Market Access Issues on the Map

Article excerpt

Developing countries can use ITC's Market Access Map to analyse market access conditions for the Doha round of trade talks.

When it comes to keeping existing export markets and finding new ones, understanding market access conditions remains a key challenge for developing countries. The WTO Ministerial meeting in December 2005 renewed the pressure on countries worldwide to agree on ways to cut tariffs and other trade barriers, meaning that 2006 will be an important year for global trade talks.

ITC's tariff and trade policy analysis tool, Market Access Map, is ready to be of help to developing countries. It provides customs tariffs and trade data of both WTO member countries and most non-members. This information is usually complex and scattered across many sources, but Market Access Map brings it together in one place, giving users a quick overview of current and future market conditions.

Stay abreast of market conditions

Companies and trade policy-makers that operate without up-to-date information or appropriate analysis do so at their peril. The results of a recent study by Nepal's Garment Association are a sobering reminder.

Nepal's garment sector contributes over 40% of the country's export earnings, with around 80% of clothing exports destined for the United States. The study found that despite more attractive tariffs in markets such as Australia, Canada, the European Union and Japan, Nepalese exporters still focused on the US, where they were losing market share.

Why? Until 31 December 2004, the WTO Agreement on Textiles and Clothing and its predecessor, the Multifibre Arrangement (MFA), allowed big developed markets like the United States to restrict imports of textiles and clothing through quotas. This gave clothing exporters in many less-competitive least developed countries years of export market security. …

Search by... Author
Show... All Results Primary Sources Peer-reviewed


An unknown error has occurred. Please click the button below to reload the page. If the problem persists, please try again in a little while.